Defect clustering and self-healing of electron-irradiated boron-rich solids

M. Carrard, D. Emin, and L. Zuppiroli
Phys. Rev. B 51, 11270 – Published 1 May 1995
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Abstract

Transmission-electron-microscopy observations are used to evaluate damage produced by irradiating boron-rich metals, semimetals, and semiconductors of three different structure types with energetic electrons. The propensity for damage increases with decreasing carrier concentration except for borides based on twelve-atom icosahedral units. In these semiconducting icosahedral borides neither defect clusters nor amorphorization were observed. In accord with studies of other icosahedral borides, we conclude that radiation-induced boron vacancies and interstitials self-heal in icosahedral borides. We explain this self-healing as having its origin in the unusual structural and electronic stability of fragments of boron-rich icosahedra, termed degraded icosahedra.

  • Received 19 September 1994

DOI:https://doi.org/10.1103/PhysRevB.51.11270

©1995 American Physical Society

Authors & Affiliations

M. Carrard

  • Laboratoire de Physique des Solides Semi-cristallins, Institut de Génie Atomique, Ecole Polytechnique Fédérale, CH 1015 Lausanne, Switzerland

D. Emin

  • Sandia National Laboratories, Albuquerque, New Mexico 87185-1421

L. Zuppiroli

  • Laboratoire de Physique des Solides Semi-cristallins, Institut de Génie Atomique, Ecole Polytechnique Fédérale, CH 1015 Lausanne, Switzerland

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Vol. 51, Iss. 17 — 1 May 1995

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