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Two- and three-dimensional extended solids and metallization of compressed XeF2

Abstract

The application of pressure, internal or external, transforms molecular solids into extended solids with more itinerant electrons to soften repulsive interatomic interactions in a tight space. Examples include insulator-to-metal transitions in O2, Xe and I2, as well as molecular-to-non-molecular transitions in CO2 and N2. Here, we present new discoveries of novel two- and three-dimensional extended non-molecular phases of solid XeF2 and their metallization. At 50 GPa, the transparent linear insulating XeF2 transforms into a reddish two-dimensional graphite-like hexagonal layered structure of semiconducting XeF4. Above 70 GPa, it further transforms into a black three-dimensional fluorite-like structure of the first observed metallic XeF8 polyhedron. These simultaneously occurring molecular-to-non-molecular and insulator-to-metal transitions of XeF2 arise from the pressure-induced delocalization of non-bonded lone-pair electrons to sp3d2 hybridization in two-dimensional XeF4 and to p3d5 in three-dimensional XeF8 through the chemical bonding of all eight valence electrons in Xe and, thereby, fulfilling the octet rule at high pressures.

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Figure 1: Micro-photographs of XeF2 samples at high pressures.
Figure 2: Pressure dependence of Raman spectra of XeF2 (open red circles) and electrical resistance (closed blue circles) as a function of pressure.
Figure 3: Angle-resolved X-ray diffraction patterns of XeF2 phases to 100 GPa.
Figure 4: Crystal structures of graphite-like 2D and fluorite-like 3D extended phases.
Figure 5: Pressure dependence of the crystal structure and chemical bonds of the XeF2 phases.

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Acknowledgements

Synchrotron X-ray diffraction studies were carried out at the GSECAR 13IDD and HPCAT 16BMD beam line at the Advanced Photon Source. The authors thank P. Dera, V. Prakapenka, O. Shebanova and A. Sengupta for their technical support. The present study was supported by DTRA (grant no. HDTRA1-09-1-0041), NSF-DMR (grant no. 0854618) and DOE-NNSA (no. DE-F603-97SF21388).

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M.K. carried out X-ray and Raman measurements and performed the analysis, including calculating the electronic structure. M.D. performed resistance measurements and analysis. C.-S.Y. was responsible for the overall design, direction and supervision of the project. All authors contributed to writing of the manuscript.

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Correspondence to Choong-Shik Yoo.

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The authors declare no competing financial interests.

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Kim, M., Debessai, M. & Yoo, CS. Two- and three-dimensional extended solids and metallization of compressed XeF2. Nature Chem 2, 784–788 (2010). https://doi.org/10.1038/nchem.724

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