Trap states in organic field-effect transistors: quantification, identification and elimination
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Author
Date
2009Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-005813523Publication status
publishedExternal links
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Publisher
ETHSubject
FELDEFFEKTTRANSISTOREN, FET (ELEKTRONIK); ORGANISCHE HALBLEITER (ELEKTROTECHNIK); ELEKTRONENZUSTÄNDE + ELEKTRONENSTRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); FIELD EFFECT TRANSISTORS, FET (ELECTRONICS); ORGANIC SEMICONDUCTORS (ELECTRICAL ENGINEERING); ELECTRON STATES + ELECTRONIC STRUCTURE (CONDENSED MATTER PHYSICS)Organisational unit
03569 - Batlogg, Bertram (emeritus)
Notes
Diss., Naturwissenschaften, Eidgenössische Technische Hochschule ETH Zürich, Nr. 18324, 2009.More
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ETH Bibliography
yes
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