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Quantitative Electron Diffraction from Thin Films

  • Quantitative Analysis of Thin Films
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References

  1. For an overview of surface diffraction methods, see M.G. Lagally, “Diffraction Techniques,” Chapter 5 in Methods of Experimental Physics, Vol. 223, Surfaces, edited by R.L. Park and M.G. Lagally (Academic Press, Orlando, Florida, 1985). See also, M.G. Lagally, “Low-Energy Electron Diffraction” and D.E. Savage, “Reflection High-Energy Electron Diffraction,” respectively Sections 4.5 and 4.6 in Encyclopedia of Materials Characterization, edited by C.R. Brundle, Evans C.A. Jr., and S. Wilson (Butterworth, Boston, 1992).

  2. For an elementary treatment of interference and diffraction from a one-dimensional grating, see E. Hecht, Optics (Addison-Wesley, Reading, 1987), Chapter 10.

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  3. M. Henzler in Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer, Berlin, 1977); M.G. Lagally, in Reflection High-Energy Electron Diffraction and Reflection Electron Imaging from Surfaces, edited by P.K. Larsen and P.J. Dobson (Plenum, London, 1989).

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  13. M.G. Lagally, in Metals Handbook, Vol. 10 (American Society for Metals, Metals Park, Ohio, 1986).

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Authors
  1. M. G. Lagally
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  2. D. E. Savage
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Lagally, M.G., Savage, D.E. Quantitative Electron Diffraction from Thin Films. MRS Bulletin 18, 24–31 (1993). https://doi.org/10.1557/S0883769400043414

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