Abstract
We describe bilayer structures comprised of a poly(p-phenylene vinylene) (PPV) layer and a trap-free diaryldiamine (TPD) doped in polycarbonate (PC) layer, sandwiched between indium-tin-oxide (ITO) and aluminum (Al) contacts. Two critical phenomena in the operation of polymer based electroluminescent devices, interface injection and carrier range, are investigated. It is established that the ITO/PPV contact is capable of sustaining dark current under trap-free space-charge-limited (TFSCL) conditions into a hole transporting TPD:PC layer. TFSCL currents are not observed in devices without the PPV layer. Upon increasing the thickness of the PPV layer a deviation from the TFSCL regime is observed which is attributed to trapping of the injected holes within PPV. These observations suggest a novel method for estimating the trapping mobility-lifetime product µτ for holes in PPV. By this means we estimate µτ ~ 10−9 cm2/V.
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Antoniadis, H., Abkowitz, M., Hsieh, B.R. et al. Space-Charge-Limited Charge Injection From ITO/PPV Into a Trap-Free Molecularly Doped Polymer. MRS Online Proceedings Library 328, 377–382 (1993). https://doi.org/10.1557/PROC-328-377
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DOI: https://doi.org/10.1557/PROC-328-377