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Configured Semiconductor/Insulator Coatings for Corrosion Prevention

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Abstract

Semiconductor and insulator coatings, appropriately configured in Metal-Semiconductor (MS) and Metal-Insulator (≈20–100Å)-Semiconductor (MIS) structural formats, are shown to result in the formation of a built-in active electronic barrier on metal surfaces. This interfacial electronic barrier impedes the transfer of electrons from the metal to oxidizing species present at the metal surface, thereby providing protection against corrosion. The effectiveness of the electronic barrier concept has been confirmed using weight-loss, and cathodic and anodic polarization measurements on aluminum samples coated with indium tin oxide ITO (semiconductor) and SiO2 (thin oxide/insulator) films. In particular, Al-ITO, Al-ITO-Si3N4, Al-SiO2-ITO, and Al-SiO2-ITO-Si3N4 structures were fabricated and tested in a 1% NaCl, pH-2 solution. The films were grown using chemical vapor deposition (CVD) and spray techniques to ensure high quality and reproducibility. Aluminum samples tested included commercial purity, high purity (polycrystalline and single crystalline), and alloy (7075-T6). The MS and MIS configurations were found to provide superior corrosion protection as compared to conventional insulating films (e.g., Al-Si3N4). The active electronic barrier approach is a generic methodology to inhibit corrosion, and it can be realized using other semiconductor/insulator combinations including semiconducting polymer coatings.

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References

  1. J.C. Scully, The Fundamentals of Corrosion, Permagon, New York (1975).

    Google Scholar 

  2. A. Bianconi, Solid State Comm., 24 539 (1977).

    Article  CAS  Google Scholar 

  3. H.L. Yu, M.C. Munoz, and F. Soria, Surface Science 94, L184 (1980).

    Article  CAS  Google Scholar 

  4. B.W. Bullett, Surface Science, 93, 213-222 (1980).

    Article  CAS  Google Scholar 

  5. J.A. Appelbaum, Electronic structure of solid surfaces, Chapter 2, in Surface Physics of Materials, Vol. 1, Ed. J.M. Blakely, Academic Press, N.Y. (1975).

    Google Scholar 

  6. M.C. Munoz, V. Martinez, J.A. Tagle, and L.D. Sacedon, Phys. Rev. Lett. 44, 814 (March 1980).

    Article  CAS  Google Scholar 

  7. S.T. Pantelides (Ed.), The Physics of SiO7 and its Interfaces, Pergamon, N.Y. (1978)

    Google Scholar 

  8. S. Roy Morrison, The Chemical Physics of Surfaces, Plenum Press, New York, 1977; also in Surface Physics of Phosphors and Semiconductors (chapter 4), Eds. C.G. Scott and C.E. Reed, Academic Press, New York (1975).

    Book  Google Scholar 

  9. J.R. Schrieffer and P. Soven, Phys. Today, 28, 24 (1975).

    Article  CAS  Google Scholar 

  10. N.D. Tomashov, Theory of Corrosion and Protection of Metals, MacMillan, New York (1966).

    Google Scholar 

  11. K. Barton, Protection Against Atmospheric Corrosion: Theories and Methods, Wiley Interscience, New York (1976).

    Google Scholar 

  12. V.E. Carter, Metallic Coatings for Corrosion Control, Newnes-Butterworths, Boston (1977).

    Google Scholar 

  13. C. Wagner, Corrosion Science 13, 23-52 (1973).

    Article  CAS  Google Scholar 

  14. A.T. Fromhold, Theory of Metal Oxidation, Vol. 1 - Fundamentals, in Series on Defects in crystalline solids, Vol. 9, North-holland (1976).

  15. A.T. Fromhold, Theory of Metal Oxidation, Vol. 2 - Space Charge, in Series on Defects in solids, Volume 12, North-Holland (1980).

  16. F. C. Jain, Semiconductor/Insulator Films in Corrosion Prevention, Private Comm. to NADC September (1980).

  17. S.M. Sze, Physics of Semiconductor Devices, second edition, John Wiley, New York (1981).

    Google Scholar 

  18. A.G. Milnes and D.L. Feucht, Heterojunctions and Metal-Semiconductor Junctions, Academic Press, N.Y. (1972).

    Google Scholar 

  19. R.S. Muller and T.I. Kamins, Device Electronics for Integrated Circuits, Wiley, N.Y. (1977).

    Google Scholar 

  20. J.M. Andrews and J. C. Phillips, Phys. Rev. Lett. 35, 56 (1975).

    Article  CAS  Google Scholar 

  21. L.J. Brillson, Phys. Rev. Lett. 42, 397 (1979).

    Article  CAS  Google Scholar 

  22. G. Ottaviani, K.N. Tu, and J.W. Mayer, Phys. Rev. Lett. 44, 284 (1980). (Reference is made to the Proceedings of Conference on Physics and Chemistry of Semiconductor Interfaces (PCSI), 1983, 1984).

    Article  CAS  Google Scholar 

  23. E.H. Nicollian, B. Schwartz, D.J. Coleman, Jr., R.M. Ryder, and J.R. Brews, J. Vac. Sci. Technol., .13, 1047, (Sept./Oct 1976).

    Article  CAS  Google Scholar 

  24. F.C. Jain and and J.W. Marciniec, IEEE J. Quantum Electronics, QE-14, 398 (1978).

    Article  Google Scholar 

  25. F.C. Jain and C.S. Nichols, Bull. Am. Phys. Soc. 25, 586 (1979); P.A. Dufilie and F.C. Jain, Ibid, 31, 884, 1986.

    Google Scholar 

  26. F.C. Jain, Electronic Barrier Formation of Metal-Semiconductor/Insulator Interfaces: A New Approach to Corrosion Prevention, Corr. Tech. Rev. Conf., August 14-16, 1984, NADC, Warminster, PA (Abstract Published).

    Google Scholar 

  27. F.C. Jain, J.J. Rosato, and K.S. Kalonia, Bull. Am. Phys. Soc. 30, 711, April 1985.

    Google Scholar 

  28. F.C. Jain, Technical Report Department of the Navy, “Semiconductor/ Insulator Films for Corrosion Prevention”, Report No. NADC-86028-60, October 1985.

  29. F.C. Jain, J.J. Rosato, K.S. Kalonia, and V.S. Agarwala, Corrosion, 42, pp. 700-707 (1986).

    Article  CAS  Google Scholar 

  30. M. Froment, Passivity of Metals and Semiconductors, Elsevier (1983). (Proceedings of the Fifth Internation Symposium on Passivity, Bombanness, France, May 30-June 3, 1983).

    Google Scholar 

  31. M.D. Fontana and N.D. Greene, Corrosion Engineering, McGraw-Hill, New York (1978).

    Google Scholar 

  32. F.C. Jain, J.J. Rosato, K.S. Kalonia, and V.S. Agarwala in Adhesives, Sealants, and Coatings for Space and Harsh Environments, edited by L-H. Lee (Plenum Publishing Corp., New York, 1988), pp. 381-405.

    Chapter  Google Scholar 

  33. J.P. Dodelet, J. Appl. Phys. 53, 4270-4277, (1982).

    Article  CAS  Google Scholar 

  34. N. Koshida and Y. Wachi, Appl. Phys. Lett. 45, 436-437, (1984).

    Article  CAS  Google Scholar 

  35. A.H. Bhuiyan and S.V. Bhoraskar, Proceedings of the ACS Division of Polymeric Materials: Science and Engineering, Vol 56, pp. 609-613, (1987).

    CAS  Google Scholar 

  36. S. Hettiarachchi, R.B. Wilson, Y.W. Chan, and V.S. Agarwala, Materials Research Society’s 1988 Spring Meeting, Abstract #N8.2, p. 266 (April 5-9).

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Jain, F.C., Rosato, J.J., Kalonia, K.S. et al. Configured Semiconductor/Insulator Coatings for Corrosion Prevention. MRS Online Proceedings Library 125, 329–341 (1988). https://doi.org/10.1557/PROC-125-329

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