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Atomic Resolution with Atomic Force Microscope

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Published under licence by IOP Publishing Ltd
, , Citation G. Binnig et al 1987 EPL 3 1281 DOI 10.1209/0295-5075/3/12/006

0295-5075/3/12/1281

Abstract

The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å.

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10.1209/0295-5075/3/12/006