An Equivalent Cicuit for CuO Modified Surface Barrier Layer Capacitors

Copyright (c) 1997 The Japan Society of Applied Physics
, , Citation Cheng-Fu Yang Cheng-Fu Yang 1997 Jpn. J. Appl. Phys. 36 188 DOI 10.1143/JJAP.36.188

1347-4065/36/1R/188

Abstract

Nb2O5-doped (Ba0.8Sr0.2)(Ti0.9Zr0.1)O3 (BSTZ) is calcined at 1170°C for the complete formation of ABO3 phases. After calcination, CuO is added to BSTZ as a liquid phase promoter and an insulating boundary layer material. After sintering in a reducing atmosphere, the fired ceramics are cooled to an annealing temperature, then the cermics are annealed in air. The loss tangents of the fabricated ceramics increase with amount of CuO addition, but the maximum grain growth and maximum dielectric constant will reveal in 1 wt% CuO-added BSTZ. For BSTZ with different amount of CuO addition, the effective dielectric constant increases with the sintering temperature and decreases critically with annealing temperature and annealing time. When 60 min is used as annealing time, lower the annealing temperature is, more broad dielectric constant-temperature curves are. It is believed that the semiconductive BSTZ, which is residual in the center of the reoxidized BSTZ, will dominate the result.

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10.1143/JJAP.36.188