Skip to main content
SpringerLink
Log in

Two-dimensional defects and the problem of the identification of a nanoscale particle structure

  • Nanotechnology
  • Published:
Semiconductors Aims and scope Submit manuscript

Abstract

It is shown that twins and antiphase boundaries can coexist in nanoscale objects. It ishas been established that twinning and ordering domains affectthe diffraction features, by distorting the reflection series in electron diffraction patterns. The structure and phase relation of nanoparticles cannot be adequately explained without preliminary studies of their defect structure.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. A. S. Barnard, R. R. Yeredla, and N. Xu, Nanotechnology 17, 3039 (2006).

    Article  Google Scholar 

  2. G. Guisbiers, G. Abulimu, F. Clement, and M. Wautelet, J. Comput. Theor. Nanosci. 4, 309 (2007).

    Google Scholar 

  3. S. K. Maksimov and K. S. Maksimov, Ross. Nanotekhnol. 4(3–4), 59 (2009).

    Google Scholar 

  4. Y. Q. Wang, W. S. Liang, and C. Y. Geng, Nanoscale Res. Lett., No. 4, 684 (2009).

  5. C. E. Carlton, L. Rabenberg, and P. J. Ferreira, Phil. Mag. Lett. 88, 715 (2008).

    Article  ADS  Google Scholar 

  6. B. Reznik, K. D. Eichhorn, and D. Gerthsen, Phil. Mag. A 82, 2665 (2002).

    Article  ADS  Google Scholar 

  7. E. Mednikov and L. Dahl, J. Cluster Sci. 16, 287 (2005).

    Article  Google Scholar 

  8. C. Frommen and H. Rosner, Mater. Lett. 58, 123 (2004).

    Article  Google Scholar 

  9. Y. Koretaka, J. Phys.: Condens. Matter. 22, 245401 (2010).

    Article  Google Scholar 

  10. A. Kovács, K. Sato, and G. Sáfrán, et al., Phil. Mag. 84, 2075 (2004).

    Article  ADS  Google Scholar 

  11. Electron Microscopy of Thin Crystals, Ed. by P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan (Plenum, New York, 1965; Mir, Moscow, 1968).

    Google Scholar 

  12. S. Amelinck and D. van Dyck, in Electron Diffraction Techniques, Ed. by J. M. Cowley (Oxford Univ. Press, Oxford, UK, 1993), Vol. 2, pp. 310–371.

    Google Scholar 

  13. S. K. Maksimov and K. S. Maksimov, Inorg. Mater. 44, 894 (2008).

    Article  Google Scholar 

  14. S. K. Maksimov and K. S. Maksimov, Inorg. Mater. 43, 551 (2007).

    Article  Google Scholar 

  15. G. B. Bokii and M. A. Porai-Koshits, A Practical Course in X-ray Structure Analysis (Mosc. Gos. Univ., Moscow, 1964) [in Russian].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Foreign trade engineering company “Advanced Worldwide Technologies”, 3-ya ul. Yamskogo Polya 2, Moscow, 125124, Russia

    K. S. Maksimov

Authors
  1. K. S. Maksimov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to K. S. Maksimov.

Additional information

Original Russian Text © K.S. Maksimov, 2011, published in Izvestiya vysshikh uchebnykh zavedenii. Elektronika, 2011, Vol. 88, No. 2, pp. 51–59.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Maksimov, K.S. Two-dimensional defects and the problem of the identification of a nanoscale particle structure. Semiconductors 45, 1699–1704 (2011). https://doi.org/10.1134/S1063782611130161

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063782611130161

Keywords

Search

Navigation