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Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine

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Abstract

A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.

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Authors and Affiliations

  1. Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia

    A. S. Sukhikh, T. V. Basova & S. A. Gromilov

  2. Novosibirsk National Research State University, Novosibirsk, Russia

    A. S. Sukhikh, T. V. Basova & S. A. Gromilov

Authors
  1. A. S. Sukhikh
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  2. T. V. Basova
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  3. S. A. Gromilov
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Correspondence to A. S. Sukhikh.

Additional information

Translated from Zhurnal Strukturnoi Khimii, Vol. 57, No. 3, pp. 648-651, March-April, 2016.

Original Russian Text © 2016 A. S. Sukhikh, T. V. Basova, S. A. Gromilov.

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Sukhikh, A.S., Basova, T.V. & Gromilov, S.A. Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine. J Struct Chem 57, 618–621 (2016). https://doi.org/10.1134/S0022476616030227

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  • DOI: https://doi.org/10.1134/S0022476616030227

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