Dimensions of luminescent oxidized and porous silicon structures

S. Schuppler, S. L. Friedman, M. A. Marcus, D. L. Adler, Y.-H. Xie, F. M. Ross, T. D. Harris, W. L. Brown, Y. J. Chabal, L. E. Brus, and P. H. Citrin
Phys. Rev. Lett. 72, 2648 – Published 18 April 1994
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Abstract

X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, α recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The mass-weighted average structures in por-Si are particles, not wires, with dimensions significantly smaller than previously reported or proposed.

  • Received 12 January 1994

DOI:https://doi.org/10.1103/PhysRevLett.72.2648

©1994 American Physical Society

Authors & Affiliations

S. Schuppler, S. L. Friedman, M. A. Marcus, D. L. Adler, Y.-H. Xie, F. M. Ross, T. D. Harris, W. L. Brown, Y. J. Chabal, L. E. Brus, and P. H. Citrin

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974
  • National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720

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Vol. 72, Iss. 16 — 18 April 1994

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