Mechanical relaxation of organic monolayer films measured by force microscopy

Stephen A. Joyce, R. C. Thomas, J. E. Houston, T. A. Michalske, and R. M. Crooks
Phys. Rev. Lett. 68, 2790 – Published 4 May 1992
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Abstract

Using the newly developed interfacial-force microscope, we present results for the first measurements of the mechanical relaxation of a Au supported, self-assembled monolayer film interacting with a microscopic tungsten tip. For a methyl-terminated n-alkanethiol film, we observe negligible adhesive film-tip interaction and complete passivation of tip-substrate bonding. The mechanical behavior of the film itself shows a time-dependent, elastic response.

  • Received 12 November 1991

DOI:https://doi.org/10.1103/PhysRevLett.68.2790

©1992 American Physical Society

Authors & Affiliations

Stephen A. Joyce, R. C. Thomas, J. E. Houston, T. A. Michalske, and R. M. Crooks

  • Sandia National Laboratories, Albuquerque, New Mexico 87185
  • Department of Chemistry, University of New Mexico, Albuquerque, New Mexico 87131

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Issue

Vol. 68, Iss. 18 — 4 May 1992

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