Observation of single-electron charging effects in small tunnel junctions

T. A. Fulton and G. J. Dolan
Phys. Rev. Lett. 59, 109 – Published 6 July 1987
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Abstract

Unusual structure and large electric-fieldinduced oscillations have been observed in the current-voltage curves of small-area tunnel junctions arranged in a low-capacitance (≲1 fF) multiple-junction configuration. This behavior arises from the tunneling of individual electrons charging and discharging the capacitance. The observations are in accord with what would be expected from a simple model of the charging energies and voltage fluctuations of e/C associated with such effects.

  • Received 6 March 1987

DOI:https://doi.org/10.1103/PhysRevLett.59.109

©1987 American Physical Society

Authors & Affiliations

T. A. Fulton and G. J. Dolan

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974

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Issue

Vol. 59, Iss. 1 — 6 July 1987

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