Abstract
Using electroreflectance spectroscopy, we have observed new optical transitions near 0.76, 1.25, and 2.31 eV in an ordered strained-layer Ge-Si superlattice. The possible origins of these transitions are discussed in terms of modification of the electronic band structure by the sample structure.
- Received 24 October 1986
DOI:https://doi.org/10.1103/PhysRevLett.58.729
©1987 American Physical Society