Apparent Size of an Atom in the Scanning Tunneling Microscope as a Function of Bias

N. D. Lang
Phys. Rev. Lett. 58, 45 – Published 5 January 1987
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Abstract

In order to determine how the sample density of states is reflected in topographic images obtained in the scanning tunneling microscope, the apparent size of an adsorbed atom is studied as a function of bias voltage for several different atoms. This quantity is found to reflect state-density features that lie well above the Fermi level, but it shows a striking absence of any trace of d-state peaks below the Fermi level.

  • Received 23 October 1986

DOI:https://doi.org/10.1103/PhysRevLett.58.45

©1987 American Physical Society

Authors & Affiliations

N. D. Lang

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 58, Iss. 1 — 5 January 1987

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