Abstract
The complete valence band in amorphous Si has been examined by photoelectron spectroscopy at photon energies of 21.2, 26.9, 40.8, and 1486.6 eV. The spectra show emission from an 11.2-eV-wide -derived valence band and from the oxygen level at 20.2 eV below the valence-band edge. Four pieces of structure in the bands are related to the single bonding and the two nonbonding orbitals of the ion. A narrow, nonbonding level found at the valence-band edge may cause lattice trapping of valence-band holes.
- Received 29 September 1971
DOI:https://doi.org/10.1103/PhysRevLett.27.1560
©1971 American Physical Society