General mobility and carrier concentration relationship in transparent amorphous indium zinc oxide films

Andrew J. Leenheer, John D. Perkins, Maikel F. A. M. van Hest, Joseph J. Berry, Ryan P. O’Hayre, and David S. Ginley
Phys. Rev. B 77, 115215 – Published 28 March 2008

Abstract

We report the dependence of the electronic properties on the metal composition and oxygen content of transparent conducting amorphous indium zinc oxide (aIZO) films deposited by dc magnetron sputtering. aIZO shows a clear Burstein–Moss shift with an effective optical band gap of 3.1eV independent of the metal composition. A metal-composition-independent dependence of the mobility (μ) on carrier concentration (N) is also found for aIZO with μmax=54cm2Vs at N=1.3×1020cm3. The electron transport, thermally activated at N1019cm3, becomes limited by lattice scattering at N1020cm3 and then by ionized impurity scattering at N>5×1020cm3.

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  • Received 24 December 2007

DOI:https://doi.org/10.1103/PhysRevB.77.115215

©2008 American Physical Society

Authors & Affiliations

Andrew J. Leenheer1, John D. Perkins2, Maikel F. A. M. van Hest2, Joseph J. Berry2, Ryan P. O’Hayre1, and David S. Ginley2,*

  • 1Department of Materials Science, Colorado School of Mines, 1800 Illinois St., Golden, Colorado 80401, USA
  • 2National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401, USA

  • *Corresponding author; daviḏginley@nrel.gov

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Vol. 77, Iss. 11 — 15 March 2008

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