Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode

J. Schmalhorst, S. Kämmerer, M. Sacher, G. Reiss, A. Hütten, and A. Scholl
Phys. Rev. B 70, 024426 – Published 30 July 2004

Abstract

Magnetic tunnel junctions with a magnetically soft Heusler-alloy electrode (Co2MnSiAl+oxidation+insituannealingCo7Fe3Mn83Ir17) and a maximal tunnel magnetoresistance effect of 86% at 10K10mV are investigated with respect to their structural and magnetic properties at the lower barrier interface by electron and x-ray absorption spectroscopy. A plasma-oxidation-induced MnSi segregation and oxide formation at the barrier interface is found, which results in a strongly increased area-resistance product of the junctions, because of an enlarged barrier thickness. For Co2MnSi thickness equal to 8nm or larger, ferromagnetic order of Mn and Co spins at the interface is induced by annealing; simultaneously, atomic ordering at the interface is observed. The influence of the structural and magnetic interface properties on the temperature-dependent transport properties of the junctions is discussed.

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  • Received 18 March 2004

DOI:https://doi.org/10.1103/PhysRevB.70.024426

©2004 American Physical Society

Authors & Affiliations

J. Schmalhorst*, S. Kämmerer, M. Sacher, G. Reiss, and A. Hütten

  • Department of Physics, University of Bielefeld, Nano Device Group, P.O. Box 100131, 33501 Bielefeld, Germany

A. Scholl

  • Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • *Electronic address: jschmalh@physik.uni-bielefeld.de

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Issue

Vol. 70, Iss. 2 — 1 July 2004

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