Volume 101, 1995

Gels from surfactant solutions with densely packed multilamellar vesicles

Abstract

Results on surfactant gels containing densely packed multilamellar vesicles are reported. The gels form spontaneously when the bilayers of Lα or L3 phases of alkyldimethylaminoxide and cosurfactant are charged up by the addition of ionic surfactant or HCl. The rheological behaviour on addition of excess salt was studied by dynamic rheological measurements for systems with surfactants of different chainlengths. Both the storage modulus, G′, and the yield stress, σy, decay with rising salinity. This effect is caused by the reduction of both the electrical contribution of the bending constants of the bilayers and the compression modulus of the vesicles. The influence of the charge density on the rheological properties was determined. G′ and σy increase with charge density and reach a plateau that depends on the chain-length of the surfactant. Measurements on samples prepared with water–glycerol mixtures show that the moduli and the yield stress value are independent of the solvent viscosity. Photographs of the surfactant gels that were taken with the interference contrast microscopy technique are presented. They reveal that some of the vesicles are much bigger than expected on the basis of TEM micrographs. The mean size of the vesicles can be estimated on basis of conductivity data. This method yields an average number of 5–6 shells per vesicle and corresponds with the value taken from the electron micrograph. The rheological data are explained with a model that was recently introduced by van der Linden. In connection with a model due to Lekkerkerker for the electric contribution of the bending constant of the bilayers and our own calculations of the osmotic pressure the van der Linden formula yields good results for describing the experimental data.

Article information

Article type
Paper

Faraday Discuss., 1995,101, 319-333

Gels from surfactant solutions with densely packed multilamellar vesicles

H. Hoffmann, C. Thunig, P. Schmiedel and U. Munkert, Faraday Discuss., 1995, 101, 319 DOI: 10.1039/FD9950100319

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