Issue 18, 2004
From the journal:

Physical Chemistry Chemical Physics

Electrical properties of short DNA oligomers characterized by conducting atomic force microscopy

Claude Nogues,a   Sidney R. Cohen,b   Shirley S. Daubeb  and  Ron Naaman*a  

* Corresponding authors

a Department of Chemical Physics, Weizmann Institute, Rehovot, Israel
E-mail: ron.naaman@weizmann.ac.il
Fax: 972-8-9344123
Tel: 972-8-9342367

b Chemical Research Support, Weizmann Institute, Rehovot, Israel

Abstract

Complementary, single-strands of DNA (ssDNA), one bound to a gold electrode and the other to a gold nanoparticle were hybridized on the surface to form a self-assembled, dsDNA bridge between the two gold contacts. The adsorption of a ssDNA monolayer at each gold interface eliminates non-specific interactions of the dsDNA with the surface, allowing bridge formation only upon hybridization. The technique used, in addition to providing a good electrical contact, offers topographical contrast between the gold nanoparticles and the non-hybridized surface and enables accurate location of the bridge for the electrical measurements. Reproducible AFM conductivity measurements have been performed and significant qualitative differences were detected between conductivity in single- and double-strand DNA. The ssDNA was found to be insulating over a 4 eV range between ±2 V under the studied conditions, while the dsDNA, bound to the gold nanoparticle, behaves like a wide band gap semiconductor and passes significant current outside of a 3 eV gap.

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Article information

DOI
https://doi.org/10.1039/B410862K
Article type
Paper
Submitted
15 Jul 2004
Accepted
09 Aug 2004
First published
20 Aug 2004

Phys. Chem. Chem. Phys., 2004,6, 4459-4466

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Electrical properties of short DNA oligomers characterized by conducting atomic force microscopy

C. Nogues, S. R. Cohen, S. S. Daube and R. Naaman, Phys. Chem. Chem. Phys., 2004, 6, 4459 DOI: 10.1039/B410862K

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