Fluorine dopant concentration effect on the structural and optical properties of spray deposited nanocrystalline ZnO thin films
Introduction
Zinc oxide (ZnO) is belonging to the II–VI group compound semiconductors. ZnO thin films are very promising materials and attracting considerable attention due to its suitable optical and electrical properties [1], [2]. It can be considered as an alternative for transparent conductive films if it doped with suitable impurities due to the fact that a high transmittance and low resistivity can be obtained simultaneously [3]. Transparent conducting oxide (TCO) films have an extensive applications in optoelectronic devices [4], TCO have a high electric conductivity and a high visible transmittance together with a wide direct optical band gap. Zinc oxide is practically useful as a transparent conducting oxide due to its large band gap (3.37 eV) [5], [6], high conductivity, easily doped and thermally stable [7]. Additionally Zinc oxide thin films have widely been investigated due to their important applications namely, as transparent electrode, antireflection coating and windows in solar cell, gas sensors and in optoelectronic and piezoelectric devices [3], [4], [5], [6], [7]. The effective way to enhance the optical and the electrical properties of ZnO is by doping it with Aluminum, fluorine etc. [3], [8], [9].
ZnO and ZnO:F can be prepared adopting many techniques including metal-organic chemical vapor deposition (MOCVD) [10], nonreactive radio frequency (RF) magnetron sputtering [4], DC magnetron sputtering [5],sol-gel spin coating [11], pulsed laser deposition (PLD) [12] and spray pyrolysis [13], [14], electron beam deposition [15]. In this study pure and Fluorine highly doped ZnO thin films were deposited by low coast spray pyrolysis technique at 450 °C substrate temperature; it is the most convenient method because of its simple,low cost, ease to add doping materials and the possibility of enhanced the film properties by the composition variation of starting solution.
Section snippets
Experimental work
Zinc chloride (ZnCl2) and Ammonium Fluoride (NH4F) were used to prepare the precursor solutions of pure and Fluorine doped ZnO and thin film. 3.407 g of ZnCl2 was dissolved in 250 ml of distilled water by heating to 90 °C for 15 min to obtain 0.1 Molarity concentration of ZnCl2 solution. To getting Fluorine doping . Three NH4F solutions with different molarity concentrations (0.1, 0.2 and 0.3 mol/ℓ) of) were prepared by dissolving (1.389, 2.315,3.241 g) of NH4F in a 250 ml of distilled water to
Structure properties
Structural properties of the spray deposited ZO (Zinc Oxide) and FZO (Fluorine Zinc oxide) thin films were determined by XRD analysis. The x-ray diffraction pattern of ZnO and ZnO:F thin films with different fluorine doping concentrations was shown in Fig. 1. The results demonstrated that the films have a polycrystalline structure, with Hexagonal wurtize phase of ZnO. The figure shows that the pure and F doped ZnO films have a preferential orientation along (002) direction and the crystallites
Conclusions
ZnO pure and Fluorine doped thin films were deposited by the Spray Pyrolysis method at 450 °C on glass substrate. The x- ray diffraction studies of the ZO and FZO films showed polycrystalline nature and wurtize phase with preferred orientation along (002) plan. The inter-planer distance (d), lattice constants (a and c), average grain size, dislocation density, the number of crystallites per unit surface area,and the strain could be determined as a function of Fluorine dopant concentration. A
Acknowledgments
The authors would like to acknowledge the assistance offered by the Department of Physics in Faculty of Science, University of Kufa/Iraq.
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