Elsevier

Optics & Laser Technology

Volume 107, November 2018, Pages 402-407
Optics & Laser Technology

Full length article
Optical and dispersion properties of thermally deposited phenol red thin films

https://doi.org/10.1016/j.optlastec.2018.06.001Get rights and content

Highlights

  • Phenol red thin films are prepared using thermal evaporation technique.

  • The crystal structural of powder of phenol red is examined as a triclinic crystal system.

  • Transmittance spectra of thin films showed an absorption region at wavelengths <800 nm.

  • The dispersion parameters are deduced from the analysis of normal dispersion.

  • As-deposited and annealed films of phenol red showed an indirect allowed transitions.

Abstract

Thin films of phenol red are prepared using thermal evaporation technique. X-ray diffraction patterns of the powder form, as-deposited and annealed thin films are examined. The crystal structure and Miller indices of phenol red are deduced. Optical properties of phenol red thin films are investigated using spectrophotometric measurements for transmittance and reflectance as a function of wavelength in the range of 200–2500 nm. The optical constants, optical transitions, dispersion parameters and third-order nonlinear susceptibility are determined for phenol red thin films. The influence of the annealing on as-deposited films at 373 for 2 h is investigated for both of structural and optical properties.

Introduction

Recent researchers have developed in using Organic materials for the fabrication of microelectronic devices. The performance of these devices is dependent on a variety of factors such as fabrication parameters, characteristics of the Organic materials used and their optical and electrical properties [1]. Thus, organic materials have grown due to the wide range of applications in photonic devices, such as sensors, light emitting diodes, solar cells, limiters, and optoelectronic devices [2]. During the last few years, interest in organic semiconductors and their thin films increased rapidly due to [3] the processing at low temperature, material variety, design flexibility, and environmental safety [4]. The organic molecules of interest for optoelectronic applications offer alternate σ and π bonds that form extended chains or rings. The construction of such alternate-bond structures produces π-electrons that are highly delocalized [5] and leading to the characteristic optical properties of these compounds.

The organic dye materials are highly desire for the optical applications due to their stellar optical properties [2], [6]. The optical behavior of materials is important to determine its usage in optoelectronic devices [7]. In the present work, we report on the study of the optical and dispersion properties of phenol red thin films. Phenol red dye (C19H14O5S) has the molecular structure that shown in Fig. 1. Thin films of phenol red are obtained by thermal evaporation technique onto quartz and glass substrates. The crystal structural of the powder of phenol red is indexed using X-ray diffraction (XRD) analysis. The optical constants (refractive and extinction indices), optical transition, dispersion parameters are deduced for phenol red films. Also, the influence of the annealing for as-deposited films at 373 for 2 h is investigated on the structural and optical properties of phenol red films.

Section snippets

Experimental procedures

The powder of phenol red purchased from sigma Aldrich company and used without additional purification. Phenol red thin films prepared using thermal vacuum evaporation technique with a high coating unit (E 306A, Edwards, England). The films deposited onto precleaned glass and quartz substrates for structural and optical measurements, respectively. The substrate temperature kept at room temperature. The deposition of phenol red films was carried out using a quartz crucible source heated slowly

Structural characterization

Fig. 2 represents XRD pattern of phenol red in the powder form in 2θ° range of 4° – 60°. Many diffraction peaks appeared in the XRD pattern, indicating that a polycrystalline nature for the phenol red. The crystal structural of phenol red is examined from the obtained XRD data using the CRYSFIRE program [13]. The result showed that phenol red is a triclinic crystal system with lattice parameters; a = 8.377 Å, b = 11.277 Å, c = 13.214 Å, α = 67.73°, β = 77.51°, γ = 78.54° and the space group is

Conclusion

Phenol red thin films are prepared using thermal evaporation technique. Some films of phenol red are annealed at 373 for 2 h. The crystal structural of powder of phenol red is examined as a triclinic crystal system with lattice parameters; a = 8.377 Å, b = 11.277 Å, c = 13.214 Å, α = 67.73°, β = 77.51°, γ = 78.54°. XRD results indicate that as-deposited and annealed thin films of phenol red are amorphous. The transmittance spectra of thin films showed an absorption region for lower wavelengths

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