Surface science lettersTheory of surface electromigration on metals: application to self-electromigration on Cu(111)
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Cited by (49)
Erratum: Electromigration occurences and its effects on metallic surfaces submitted to high electromagnetic field: A novel approach to breakdown in accelerators (Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment)
2012, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated EquipmentElectromigration occurences and its effects on metallic surfaces submitted to high electromagnetic field: A novel approach to breakdown in accelerators
2011, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated EquipmentCitation Excerpt :In this case, temperature ranges are higher (300–500 K), measurement conditions are very different than in the FIM experiment and figures have to be taken with caution. In Ref. [35] it is found that the modification of activation energy is expected to be 10−8–10−9 eV per mV cm−1 for surface electromigration on copper. If these figures were still valid for high fields about or above 100 MV/m, it would mean that the potential barrier would disappear at high fields and atoms would become free to move like in the liquid phase.
Controlling directed transport in two-dimensional periodic structures under crossed electric fields
2004, Physica A: Statistical Mechanics and its ApplicationsTheory of surface electromigration on heterogeneous metal surfaces
2001, Applied Surface Science
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