The use of barrier parameters for the characterization of electron tunneling conductance curves☆

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Abstract

This paper deals with barrier parameters calculated from the coefficients of polynomial fits to electron tunneling conductance curves for a large sample of junctions with various types of barriers. Methods of data handling, along with a comparison of the results from two different parameter calculations are shown. Finally, relationships between the barrier parameters and other junction characteristics — particularly RA, the product of junction resistance with area (a simple and extremely useful parameter) — are discussed.

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Supported in part by the National Research Council of Canada.

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