Abstract
Fluorine-doped tin oxide (SnO2:F, FTO) thin films were prepared by the nebulized spray pyrolysis technique on glass substrates using tin(IV) chloride pentahydrate (SnCl2·5H2O) and ammonium fluoride (NH4F) as source materials. Different volumes of solvent were used to prepare the spray solution, and their effects on structural, optical, morphological, and electrical properties were investigated. X-ray diffraction patterns revealed the polycrystalline tetragonal structure of FTO films. FESEM images demonstrated well-aligned trigonal-shaped nano-grains. Optical band gap values were estimated to be in the range of 3.71–3.66 eV by Tauc’s plot. The effects of solvent volume on the resistivity, conductivity, carrier concentration, mobility, and figure of merit of FTO films were examined. The lowest electrical resistivity and sheet resistance values were 1.90 × 10−4 Ω cm and 4.96 Ω/cm, respectively.
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Acknowledgements
This study was fully supported by DST (India) under the scheme of the Science and Engineering Research Board (SERB), DST. No. SB/FTP/PS-131/2013. This study was also partly supported by the Ministry of Trade, Industry and Energy (MOTIE, Korea) under the Sensor Industrial Technology Innovation Program (No. 10063682) and the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2017R1D1A1A09000823).
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Kumar, K.D.A., Valanarasu, S., Jeyadheepan, K. et al. Evaluation of the physical, optical, and electrical properties of SnO2: F thin films prepared by nebulized spray pyrolysis for optoelectronics. J Mater Sci: Mater Electron 29, 3648–3656 (2018). https://doi.org/10.1007/s10854-017-8295-2
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DOI: https://doi.org/10.1007/s10854-017-8295-2