Abstract
The mechanism of charge carrier transport through 3D assemblies of ZnSe and CdSe quantum dots with zincblende structure in weak size-quantization regime was investigated. The Debye length in the case of ZnSe QDs was found to be 11.5 nm, i.e. almost three times larger than the average diameter of the nanocrystals constituting the films annealed at 250 °C. In CdSe QDs, on the other hand, the Debye’s length of 11.8 nm was almost twice smaller than the average crystal diameter in the films annealed at 300 °C. In the case of ZnSe QD assemblies, it was found that the predominant mechanism governing the charge carrier transport in temperature range from 380 to 650 K is the thermionic emission, with the trap levels taking part in the formation of crystal boundary barrier being located above the Fermi level. Combining temperature-dependent conductivity data with the data from optical absorption studies, the actual position of the trap level was estimated to be at about 0.37 eV (referred to the intrinsic Fermi level at the interface). In contrast to the case of ZnSe, the temperature dependence of conductivity in the case of thin films composed by 3D assemblies of CdSe QDs appeared to be much more complex. In the highest temperature region in which the temperature-dependent conductivity measurements were performed for this system (from 480 to 540 K), it was found that the thermally activated band-to-band electronic transitions govern the conductivity changes, the corresponding thermal band gap energy being 1.85 eV. In the lower-temperature region, down to 300 K, the thermionic emission was found to be predominant charge carrier transport mechanism, with trap levels being positioned above the Fermi level. The two detected trap levels were found to be located at 0.46 and 0.79 eV, corresponding to the measured conductivity activation energies of 0.84 and 0.51 eV.
Similar content being viewed by others
References
J.W. Orton, M.J. Powell, Rep. Prog. Phys. 43, 1263 (1980)
P.C. Mathur, A.K. Shukla, R.P. Sharma, P.K. Goyal, J. Electron. Mater. 12, 483 (1983)
T.H. Myers, S.W. Edwards, J.F. Schetzina, J. Appl. Phys. 52, 4231 (1981)
R.P. Sharma, A.K. Shukla, A.K. Kapoor, R. Srivastava, P.C. Mathur, J. Appl. Phys. 57, 2026 (1985)
P.Y. Yu, M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1999)
Y. Wang, N. Herron, J. Phys. Chem. 95, 525 (1991)
C.R. Kagan, C.B. Murray, M. Nirmal, M.G. Bawendi, Phys. Rev. Lett. 76, 1517 (1996)
C.R. Kagan, C.B. Murray, M.G. Bawendi, Phys. Rev. B 54, 8633 (1996)
F. Gindele, R. Westphäling, U. Woggon, L. Spanhel, V. Ptatschek, Appl. Phys. Lett. 71, 2181 (1997)
M.V. Artemyev, A.I. Bibik, L.I. Gurinovich, S.V. Gaponenko, U. Woggon, Phys. Rev. B 60, 1504 (1999)
M.V. Artemyev, U. Woggon, H. Jaschinski, L.I. Gurinovich, S.V. Gaponenko, J. Phys. Chem. B 104, 11617 (2000)
M.V. Artemyev, A.I. Bibik, L.I. Gurinovich, S.V. Gaponenko, H. Jaschinski, U. Woggon, Phys. Status Solidi B 224, 393 (2001)
B.S. Kim, M.A. Islam, L.E. Brus, I.P. Herman, J. Appl. Phys. 89, 8127 (2001)
D.E. Kim, M.A. Islam, L. Avila, I.P. Herman, J. Phys. Chem. B 107, 6318 (2003)
U. Landman, W.D. Luedtke, Faraday Discuss. 124, 1 (2004)
A.D. Yoffe, Adv. Phys. 51, 799 (2002)
C. Burda, X. Chen, R. Narayanan, M.A. El-Sayed, Chem. Rev. 105, 1025 (2005)
K. Seeger, Semiconductor Physics (Springer, New York, 1997)
R. Dalven, Introduction to Applied Solid State Physics (Plenum Press, New York, 1990)
S.M. Sze, Semiconductor Devices, Physics and Technology (Wiley, New York, 1985)
J.Y.W. Seto, J. Appl. Phys. 46, 5247 (1975)
R.P. Sharma, A.K. Shukla, A.K. Kapoor, R. Srivastava, P.C. Mathur, J. Appl. Phys. 57, 2026 (1985)
G. Baccarani, B. Riccò, G. Spadini, J. Appl. Phys. 49, 5565 (1978)
D.S. Ginger, N.C. Greenham, J. Appl. Phys. 87, 1361 (2000)
J.W. Orton, B.J. Goldsmith, M.J. Powell, J.A. Chapman, Appl. Phys. Lett. 37, 557 (1980)
N.F. Mott, J. Non-cryst. Solids 8–10, 1 (1972)
J.W. Orton, B.J. Goldsmith, J.A. Chapman, M.J. Powell, J. Appl. Phys. 53, 1602 (1982)
C.-L. Shieh, S. Wagner, L.L. Kazmerski, Mater. Lett. 3, 415 (1985)
L.L. Kazmerski, J. Vac. Sci. Technol. 20, 423 (1982)
L.L. Kazmerski, Y.J. Juang, J. Vac. Sci. Technol. 14, 769 (1977)
L.L. Kazmerski, M.S. Ayyagari, G.A. Sanborn, J. Appl. Phys. 46, 4865 (1975)
L.L. Kazmerski, M.S. Ayyagari, F.R. White, G.A. Sanborn, J. Vac. Sci. Technol. 13, 139 (1976)
L.L. Kazmerski, C.C. Shieh, Thin Solid Films 41, 35 (1977)
L.L. Kazmerski, D.M. Racine, Thin Solid Films 30, L19 (1975)
L.L. Kazmerski, W.B. Berry, C.W. Allen, J. Appl. Phys. 43, 3515 (1972)
L.L. Kazmerski, W.B. Berry, C.W. Allen, J. Appl. Phys. 43, 3521 (1972)
M.V. Garcia-Cuenca, J.L. Morenza, J. Esteve, J. Appl. Phys. 56, 1738 (1984)
I. Balberg, J. Appl. Phys. 110, 061301 (2011)
M. Manheller, S. Karthäuser, R. Waser, K. Blech, U. Simon, J. Phys. Chem. C 116, 20657 (2012)
V.P. Kunets, M.R.S. Dias, T. Rembert, M.E. Ware, YuI Mazur, V. Lopez-Richard, H.A. Mantooth, G.E. Marques, G.J. Salamo, J. Appl. Phys. 113, 183709 (2013)
H. Lepage, A. Kaminski-Cachopo, A. Poncet, G. le Carval, J. Phys. Chem. C 116, 10873 (2012)
B. Pejova, I. Bineva, J. Phys. Chem. C 117, 7303 (2013)
B. Pejova, I. Grozdanov, D. Nesheva, A. Petrova, Chem. Mater. 20, 2551 (2008)
B. Pejova, A. Tanuševski, J. Phys. Chem. C 112, 3525 (2008)
B. Pejova, B. Abay, J. Phys. Chem. C 115, 23241 (2011)
B. Pejova, D. Nesheva, Z. Aneva, A. Petrova, J. Phys. Chem. C 115, 37 (2011)
B. Pejova, J. Phys. Chem. C 117, 19689 (2013)
B. Pejova, J. Solid State Chem. 207, 147 (2013)
B. Pejova, A. Tanuševski, I. Grozdanov, J. Solid State Chem. 172, 381 (2003)
B. Pejova, A. Tanuševski, I. Grozdanov, J. Solid State Chem. 174, 276 (2003)
B. Pejova, I. Grozdanov, Mater. Lett. 58, 666 (2004)
B. Pejova, A. Tanuševski, I. Grozdanov, J. Solid State Chem. 177, 4785 (2004)
B. Pejova, Mater. Chem. Phys. 119, 367 (2010)
B. Pejova, B. Abay, I. Bineva, J. Phys. Chem. C 114, 15280 (2010)
B. Pejova, I. Grozdanov, Mater. Chem. Phys. 90, 35 (2005)
H. Hofmeister, D. Nesheva, Z. Levi, S. Hopfe, S. Matthias, in Proceedings of EUREM 12, Brno, Czechoslovak Society for Electron Microscopy, Brno, 2009, ed. by C. L. Frank, F. Ciampor, p. 365
A. Earnshaw, N. Greenwood, Chemistry of the Elements, 2nd edn. (Elsevier, Amsterdam, 2005)
Handbook of Chemistry and Physics, 64th edn. (CRC Press, 1983–1984)
S. Gorer, G. Hodes, J. Phys. Chem. 98, 5338 (1994)
M.T. Weller, Inorganic Materials Chemistry (Oxford University Press, Oxford, 1997)
P. Atkins, J. De Paula, Atkins’ Physical Chemistry, 8th edn. (Oxford University Press, Oxford, 2006)
C.F. Klingshirin, Semiconductor Optics (Springer, Berlin, 1997)
P.Y. Yu, M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1999)
M.A. Lampert, Injection Currents in Solids (Academic Press, New York, 1965)
M.V. Garcia-Cuenca, J.L. Morenza, J. Esteve, J. Appl. Phys. 56, 1738 (1984)
A. B. Novoselova (ed.), Physical and Chemical Properties of Semiconductors—Handbook (Moscow, 1978)
P. Gupta, S. Chaudhuri, A.K. Pal, J. Phys. D Appl. Phys. 26, 1709 (1993)
I. Günal, M. Parlak, J. Mater. Sci. Mater. Electron. 8, 9 (1997)
Acknowledgments
This study has been supported under the bilateral agreement between the Bulgarian Academy of Sciences and Macedonian Academy of Sciences and Arts, Project “Investigation of the surface morphology of nanostructured thin films by scanning probe microscopy”.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Pejova, B., Bineva, I. Charge carrier transport through 3D assemblies of zincblende CdSe and ZnSe quantum dots in weak size-quantization regime. J Mater Sci: Mater Electron 26, 4944–4955 (2015). https://doi.org/10.1007/s10854-015-3006-3
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-015-3006-3