Skip to main content
Log in

A fast and robust convolutional neural network-based defect detection model in product quality control

  • ORIGINAL ARTICLE
  • Published:
The International Journal of Advanced Manufacturing Technology Aims and scope Submit manuscript

Abstract

The fast and robust automated quality visual inspection has received increasing attention in the product quality control for production efficiency. To effectively detect defects in products, many methods focus on the hand-crafted optical features. However, these methods tend to only work well under specified conditions and have many requirements for the input. So the work in this paper targets on building a deep model to solve this problem. The elaborately designed deep convolutional neural networks (CNN) proposed by us can automatically extract powerful features with less prior knowledge about the images for defect detection, while at the same time is robust to noise. We experimentally evaluate this CNN model on a benchmark dataset and achieve a fast detection result with a high accuracy, surpassing the state-of-the-art methods.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Zhao YJ, Yan YH, Song KC (2017) Vision-based automatic detection of steel surface defects in the cold rolling process: considering the influence of industrial liquids and surface textures. Int J Adv Manuf Technol 90 (5-8):1665–1678

    Article  Google Scholar 

  2. Li D, Liang LQ, Zhang WJ (2014) Defect inspection and extraction of the mobile phone cover glass based on the principal components analysis. Int J Adv Manuf Technol 73(9-12):1605–1614

    Article  Google Scholar 

  3. Cabral JDD, de Araújo SA (2015) An intelligent vision system for detecting defects in glass products for packaging and domestic use. Int J Adv Manuf Technol 77(1-4):485–494

    Article  Google Scholar 

  4. Ngan HY, Pang GK, Yung NH (2011) Automated fabric defect detection—a review. Image Vis Comput 29(7):442–458

    Article  Google Scholar 

  5. Tao F, Cheng Y, Da Xu L, Zhang L, Li BH (2014) Cciot-cmfg: cloud computing and internet of things-based cloud manufacturing service system. IEEE Trans Ind Inf 10(2):1435–1442

    Article  Google Scholar 

  6. Tao F, Zuo Y, Da Xu L, Zhang L (2014) Iot-based intelligent perception and access of manufacturing resource toward cloud manufacturing. IEEE Trans Ind Inf 10(2):1547–1557

    Article  Google Scholar 

  7. Tolba A, Raafat H (2015) Multiscale image quality measures for defect detection in thin films. Int J Adv Manuf Technol 79(1-4):113–122

  8. Tolba A, Atwan A, Amanneddine N, Mutawa A, Khan H (2010) Defect detection in flat surface products using log-gabor filters. Intern J Hybrid Intell Syst 7(3):187– 201

    Article  Google Scholar 

  9. Sajid T, Ali B (2012) Fabric defect detection in textile images using gabor filter. IOSR J Electric Electron Eng 3(2):33–38

    Article  Google Scholar 

  10. Li Y, Zhang C (2016) Automated vision system for fabric defect inspection using gabor filters and pcnn. SpringerPlus 5(1):765

    Article  Google Scholar 

  11. Tsai DM, Chen MC, Li WC, Chiu WY (2012) A fast regularity measure for surface defect detection. Mach Vis Appl 23(5):869–886

    Article  Google Scholar 

  12. Chaouch H, Najeh T, Nabli L (2017) Multi-variable process data compression and defect isolation using wavelet pca and genetic algorithm. Int J Adv Manuf Technol 91(1-4):869–878

  13. Li J, Tao F, Cheng Y, Zhao L (2015) Big data in product lifecycle management. Int J Adv Manuf Technol 81(1-4):667–684

    Article  Google Scholar 

  14. Tao F, Cheng J, Qi Q, Zhang M, Zhang H, Sui F (2017) Digital twin-driven product design, manufacturing and service with big data. Int J Adv Manuf Technol 4:1–14

  15. Weimer D, Scholz-Reiter B, Shpitalni M (2016) Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection. CIRP Ann Manuf Technol 65(1):417–420

    Article  Google Scholar 

  16. Krizhevsky A, Sutskever I, Hinton GE (2012) Imagenet classification with deep convolutional neural networks. In: Advances in neural information processing systems, pp 1097–1105

  17. Ren S, He K, Girshick R, Sun J (2015) Faster r-cnn: towards real-time object detection with region proposal networks. In: Advances in neural information processing systems, pp 91–99

  18. Redmon J, Divvala S, Girshick R, Farhadi A (2016) You only look once: unified, real-time object detection. In: Proceedings of the IEEE conference on computer vision and pattern recognition, pp 779–788

  19. He K, Zhang X, Ren S, Sun J (2015) Delving deep into rectifiers: Surpassing human-level performance on imagenet classification. In: Proceedings of the IEEE international conference on computer vision, pp 1026–1034

  20. Jager M, Knoll C, Hamprecht FA (2008) Weakly supervised learning of a classifier for unusual event detection. IEEE Trans Image Process 17(9):1700–1708

    Article  MathSciNet  Google Scholar 

  21. Srivastava N, Hinton G, Krizhevsky A, Sutskever I, Salakhutdinov R (2014) Dropout: a simple way to prevent neural networks from overfitting. J Mach Learn Res 15(1):1929–1958

    MathSciNet  MATH  Google Scholar 

  22. Ioffe S, Szegedy C (2015) Batch normalization: accelerating deep network training by reducing internal covariate shift. arXiv preprint arXiv:1502.03167

  23. Jiang X, Scott P, Whitehouse D (2008) Wavelets and their applications for surface metrology. CIRP Ann Manuf Technol 57(1):555–558

    Article  Google Scholar 

  24. Siebel NT, Sommer G (2008) Learning defect classifiers for visual inspection images by neuro-evolution using weakly labelled training data. In: IEEE congress on evolutionary computation, 2008. CEC 2008. (IEEE World congress on computational intelligence). IEEE, pp 3925–3931

  25. Timm F, Barth E (2011) Non-parametric texture defect detection using weibull features. In: IS&T/SPIE electronic imaging, pp 78,770j–78,770j. International Society for Optics and Photonics, pp 78,770j–78,770j

Download references

Acknowledgements

This work is partially supported by the ANR AutoFerm project and the Platform CAPSEC funded by Région Champagne-Ardenne and FEDER, the Fundamental Research Funds for the Central Universities (YWF-14-RSC-102), the National Natural Science Foundation of China (U1435220, 61503017), the Aeronautical Science Foundation of China (2016ZC51022).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Tian Wang.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Wang, T., Chen, Y., Qiao, M. et al. A fast and robust convolutional neural network-based defect detection model in product quality control. Int J Adv Manuf Technol 94, 3465–3471 (2018). https://doi.org/10.1007/s00170-017-0882-0

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00170-017-0882-0

Keywords

Navigation