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Atomic Force Microscopy: A Versatile Tool for Studying Cell Morphology, Adhesion and Mechanics

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Abstract

The atomic force microscope (AFM), a member of the scanning probe family of microscopes, generates height maps of sample surfaces with subnanometer resolution. Importantly, AFM offers the opportunity to image samples with little or no treatment and under physiologically-relevant conditions, making it well-suited for investigating the structure of biological samples, including fixed or living cells and tissues. In addition to its high-resolution imaging capability, AFM used in force spectroscopy mode is a sensitive force measuring device, able to detect or exert forces ranging from the pico- to the nanonewton scale. Here we review a broad range of cell biological applications of AFM, including high resolution imaging of adherent cells, measuring cell adhesion down to the single-receptor level and characterizing the mechanical properties of cells. Furthermore, we present recent examples of how the combined use of AFM and advanced light microscopy techniques can provide complementary structural information.

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Acknowledgments

The authors want to thank Pr. D.J. Müller for his invaluable help and for introducing them to AFM. A. Taubenberger, M. Krieg, J. Friedrich, Dr. J. Helenius and Dr. K. Poole are thanked for their valuable input in the described experiments. JPK Instruments’s continuous support is greatly acknowledged. This work was supported by the DFG Research Center for Functional Nanostructures, Karlsruhe, Germany.

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  1. Center for Functional Nanostructures, Universität Karlsruhe (TH), Zoologisches Institut I, Haid-und-Neu-Str. 9, 76131, Karlsruhe, Germany

    C. M. Franz

  2. INSERM UMR 600/CNRS UMR 6212, Case 937, 163 avenue de Luminy, 13288, Marseille Cedex 09, France

    P.-H. Puech

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Franz, C.M., Puech, PH. Atomic Force Microscopy: A Versatile Tool for Studying Cell Morphology, Adhesion and Mechanics. Cel. Mol. Bioeng. 1, 289–300 (2008). https://doi.org/10.1007/s12195-008-0037-3

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