Abstract
XRD Diffraction measurements show that the powder of erythrosine B has poly-structure but very homogeneous thin films of erythrosine B have been successfully performed on a quartz substrate using the spin coating techniques and the structure of deposited films has been changed into amorphous form. The effect of UV radiation onto the erythrosine B thin films has been studied. XRD diffraction spectra indicate no influence of UV radiation upon the amorphous structure of erythrosine B thin films. The spectral behavior and optical properties of thin films were determined using spectrophotometric measurements of transmittance and reflectance in the wavelength range 200–2500 nm. Optical measurements of pristine and UV-irradiated erythrosine B films showed normal dispersion of the refractive index n at λ > 850 nm and anomalous dispersion at λ < 850 nm. The dispersion curve showed different response to UV irradiation depending on the wavelength of incident light. The dispersion curve showed different response to UV irradiation depending on the wavelength of incident light. Some of dispersion parameters such as the high-frequency dielectric constant (ε∞), the lattice dielectric constant (εL), the dispersion energy (Ed), ratio of the free charge carrier concentration to effective mass (N/m*) and the oscillator energy (Eo) were calculated. The optical functions such as the real (ε1), imaginary (ε2) parts of the dielectric constant, the real (σ1), imaginary (σ2) parts of electrical conductivity, and the volume and the surface energy loss (VEL and SEL) were estimated and their response to UV irradiation was discussed.
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Atwee, T., El-Mallah, H.M., Zeyada, H.M. et al. Structural, dispersion and optical functions studies of UV-irradiated erythrosine B thin films prepared by spin coating technique. Appl. Phys. A 124, 554 (2018). https://doi.org/10.1007/s00339-018-1964-z
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DOI: https://doi.org/10.1007/s00339-018-1964-z