Abstract
We have developed a process to fabricate a cross-bar structure using UV-curable nanoimprint lithography with a UV-curable double-layer spin-on resist, metal lift off and Langmuir–Blodgett film deposition. This process allowed us to produce 1-kbit cross-bar memory circuits at 30-nm half-pitch on both top and bottom electrodes. Read, write, erase and cross talking were also investigated.
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S.Y. Chou, P.R. Krauss, P.J. Renstrom: J. Vac. Sci. Technol. B 14, 4129 (1996)
M. Colburn, S. Johnson, M. Stewart, S. Damle, B.J. Choi, T. Bailey, M. Wedlaye, T. Michealson, S.V. Sreenivasan, J. Ekerdt, C.G. Willson: Proc. SPIE 3676, 379 (1999)
W. Wu, H. Ge, M. Austin, N. Li, X. Huang, M. Li, H. Tan, X. Lei, Q. Xia, S. Bai, H. Gao, S.Y. Chou: in EIPBN, San Diego, CA 2004
S.Y. Chou, P.R. Krauss, P.J. Renstrom: Science 272, 85 (1996)
Y. Chen, G.Y. Jung, D.A.A. Ohlberg, X. Li, D. Stewart, J. Jeppesen, K.A. Nielsen, J.F. Stoddart, R.S. Williams: Nanotechnology 14, 462 (2003)
G.Y. Jung, S. Ganapathiappan, X. Li, D.A. Ohlberg, D.L. Olynick, Y. Chen, W.M. Tong, R.S. Williams: Appl. Phys. A: Mater. Sci. Process. 78, 1169 (2004)
G.Y. Jung, S. Ganapathiappan, D.A.A. Ohlberg, D.L. Olynick, Y. Chen, W.M. Tong, R.S. Williams: Nano Lett. 4, 1225 (2004)
G.Y. Jung, Z. Li, W. Wu, W.M. Tong, Y. Chen, S.Y. Wang, R.S. Williams: accepted by Langmuir
M.D. Austin, H.X. Ge, W. Wu et al.: Appl. Phys. Lett. 84, 5299 (2004)
S.C. Chang, Z.Y. Li, C.N. Lau et al.: Appl. Phys. Lett. 83, 3198 (2003)
H. Ge, W. Wu, Z. Li et al.: Nano Lett. (2005) accepted
C. Hedlund, H.-O. Blom, S. Berg: J. Vac. Sci. Technol. A 12, 1962 (1992)
J.R. Heath, P.J. Kuekes, G.S. Snider, R.S. Williams: Science 280, 1716 (1998)
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85.40.Hp; 81.07.-b; 81.16.Nd; 85.65.+h
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Wu, W., Jung, GY., Olynick, D. et al. One-kilobit cross-bar molecular memory circuits at 30-nm half-pitch fabricated by nanoimprint lithography. Appl. Phys. A 80, 1173–1178 (2005). https://doi.org/10.1007/s00339-004-3176-y
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DOI: https://doi.org/10.1007/s00339-004-3176-y