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Scanned probe imaging of nanoscale conducting channels in Pt/alkanoic acid monolayer/Ti devices

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Abstract

The mechanisms responsible for switching in metal/molecule/metal systems are subjects of intense research. We report here a scanned probe technique that maps the conductance of a planar molecular junction (Pt/stearic acid monolayer/Ti) under mechanical perturbation by using an atomic force microscope (AFM) to apply a localized force to a molecular junction while measuring the junction conductance. Such mechano-conductance maps reveal that transport through the molecular device is dominated by nanoscale conducting channels, which emerged or disappeared when the junction is switched into higher or lower conductance states. A quantitative model that combines quantum tunneling with the growth of nano-asperities effectively describes the experimental conductance data across a wide range of device conductance.

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Authors and Affiliations

  1. Hewlett-Packard Laboratories, Palo Alto, CA, 94304, USA

    C.N. Lau, D.R. Stewart & R. Stanley Williams

  2. Department of Applied Physics, California Institute of Technology, Pasadena, CA, 91101, USA

    M. Bockrath

Authors
  1. C.N. Lau
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  2. D.R. Stewart
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  3. M. Bockrath
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  4. R. Stanley Williams
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Corresponding author

Correspondence to C.N. Lau.

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PACS

68.37.Ps; 73.23.-b; 73.63.-b; 81.07.Pr; 85.65.+h

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Lau, C., Stewart, D., Bockrath, M. et al. Scanned probe imaging of nanoscale conducting channels in Pt/alkanoic acid monolayer/Ti devices. Appl. Phys. A 80, 1373–1378 (2005). https://doi.org/10.1007/s00339-004-3171-3

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  • DOI: https://doi.org/10.1007/s00339-004-3171-3

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