Crystal morphology of rapidly cooled isotactic polypropylene: A comparative study by TEM and AFM

Abstract

The morphology of crystals, formed at the surface and in the bulk of rapidly cooled and subsequently at elevated temperature annealed films of isotactic polypropylene (iPP) was analyzed by transmission electron microscopy (TEM) and by atomic force microscopy (AFM). Both techniques show a lamellar crystals after melt-crystallization at 12 K s^-1, and a nodules after melt-crystallization at 750 K s^-1. The morphology of crystals is independent on the position of the investigated film of thickness of 100 μm, suggesting (a) that the crystallization at the surface is not affected by the use of a glass substrate for preparation, and (b) that the temperature-gradient during primary crystallization is sufficiently small to ensure identical structure at the surface and in the bulk. AFM suggests a larger size of crystals than TEM, in particular if the absolute size of objects approaches the dimensions of the used tip of the AFM. If the absolute size of objects is distinctly larger, then AFM and TEM yield nearly identical dimensional information.