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Optical properties of thin films and the Berreman effect

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Abstract

The measurement of reflection and transmission of normally incident light to obtain the optical constants of a material is a usual tool in solid-state spectroscopy. If the material under investigation is a thin film, the interaction of the electromagnetic field with the sample can be enhanced by oblique incidence. If the light is p-polarized, structures in the reflection and transmission spectra are observed at the frequencies of transverse (TO) and longitudinal (LO) resonances. The LO structure — called the Berreman effect — is generated by the surface charges due to the normal component of the electric field. We discuss this effect for three cases: a free film, a film with a metallic back and a substrate with thin films on both sides. The dependence of the effect on the energy-loss function Im {−1/ɛ} and on the film thickness is discussed. For idealized systems simple formulae are derived and a characteristic parameter, called the Berreman thickness, is obtained. Films of this thickness show a maximum effect. Intuitive arguments are given to explain the effect. Examples for the application of the Berreman effect to characterize very thin films are discussed.

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Harbecke, B., Heinz, B. & Grosse, P. Optical properties of thin films and the Berreman effect. Appl. Phys. A 38, 263–267 (1985). https://doi.org/10.1007/BF00616061

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  • DOI: https://doi.org/10.1007/BF00616061

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