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Angle-Scanned Photoelectron Diffraction

A structural probe for near-surface atomic layers

  • Chapter
Chemisorption and Reactivity on Supported Clusters and Thin Films

Part of the book series: NATO ASI Series ((NSSE,volume 331))

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Abstract

Electrons emitted from the core levels of a photon-irradiated crystalline sample undergo scattering by atoms in the vicinity of the emitting species. Subsequent interference phenomena between the electron wave portions propagating to the detector produce intensity modulations as a function of the direction of detection. This process constitutes the physical basis of the angle-scanned X-ray Photoelectron Diffraction (XPD) technique. The resulting modulations, properly interpreted, are rich in structural information concerning the near-surface atomic layers.

In the present notes, after an introduction to the principles of XPD, some selected results in the field of chemisorption and ultrathin epitaxial films will be reported in order to outline the merits of the technique. Qualitative structural information (e.g. growth modes and lattice distortions, orientation of chemisorbed molecules) can be directly obtained from the experimental raw data without any need of theoretical simulation. On the other hand, quantitative structural parameters and chemisorption sites may be deduced by using a trial-and-error fitting procedure based on simple single-scattering models.

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Author information

Authors and Affiliations

  1. Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, Università di Padova, via Loredan 4, 35131, Padova, Italy

    Gaetano Granozzi & Mauro Sambi

Authors
  1. Gaetano Granozzi
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  2. Mauro Sambi
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Editor information

Editors and Affiliations

  1. Department of Chemistry, University of Cambridge, Cambridge, UK

    Richard M. Lambert

  2. Department of Inorganic, Organometallic and Analytical Chemistry, University of Milan, Milan, Italy

    Gianfranco Pacchioni

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Granozzi, G., Sambi, M. (1997). Angle-Scanned Photoelectron Diffraction. In: Lambert, R.M., Pacchioni, G. (eds) Chemisorption and Reactivity on Supported Clusters and Thin Films. NATO ASI Series, vol 331. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8911-6_9

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  • DOI: https://doi.org/10.1007/978-94-015-8911-6_9

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-4807-3

  • Online ISBN: 978-94-015-8911-6

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