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Resolution and Contrast Generation in Scanning Near Field Optical Microscopy

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Scanning Tunneling Microscopy and Related Methods

Part of the book series: NATO ASI Series ((NSSE,volume 184))

Abstract

In scanning near field optical microscopy (SNOM), an antenna of subwavelength size is scanned accross the object in close proximity. The modulated light emission due to near field interactions with the object is recorded for image formation. With 50 — 100 nm apertures in a metal film or protrusions serving as antennas a resolution of 30 — 100 nm — limited by the antenna size — is demonstrated. Phase contrast depending on electric excitation and contrast enhancement depending on local plasmon excitation of the antenna are demonstrated in two types of reflection mode SNOM, one of which — scanning optical tunneling microscopy — is closely analogous to STM.

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Author information

Authors and Affiliations

  1. Nanotec GmbH, D 6330, Wetzlar, Germany

    U. Ch. Fischer

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  1. U. Ch. Fischer
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Editor information

Editors and Affiliations

  1. Institut für Kristallographie und Mineralogie, Universität München, München, Germany

    R. J. Behm

  2. Department of Physics, Universidad Autonoma de Madrid, Madrid, Spain

    N. Garcia

  3. IBM Research Division, Zurich Research Laboratory, Ruschlikon, Switzerland

    H. Rohrer

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© 1990 Springer Science+Business Media Dordrecht

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Fischer, U.C. (1990). Resolution and Contrast Generation in Scanning Near Field Optical Microscopy. In: Behm, R.J., Garcia, N., Rohrer, H. (eds) Scanning Tunneling Microscopy and Related Methods. NATO ASI Series, vol 184. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-7871-4_27

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  • DOI: https://doi.org/10.1007/978-94-015-7871-4_27

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-4075-6

  • Online ISBN: 978-94-015-7871-4

  • eBook Packages: Springer Book Archive

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