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Scanning Conductive Torsion Mode Microscopy

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Surface Science Tools for Nanomaterials Characterization

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Abstract

In this chapter, we introduce a special non-contact scanning probe based current sensing technique: scanning conductive torsion mode microscopy (SCTMM), which allows for simultaneous topography and electrical current mapping on solid samples. Due to the low interacting force between the probe and sample surface, this new technique is particularly indicated for and usually applied to measurements on soft materials and fragile structures. We first describe the working principle and discuss the advantages of the technique and its limitations. We also review recent applications of this technique, including studies of structure-properties relationship, local conductivity of nanopillar arrays, electropolymerization of conjugated polymers, and molecular orientation of self-assembly structures. In the end, we discuss some potential improvements of future scanning probe based current sensing techniques.

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Author information

Authors and Affiliations

  1. Department of Micro- and Nanotechnology, Technical University of Denmark, Ørsteds Plads, Kgs. Lyngby, 2800, Denmark

    Ling Sun

  2. Center of Smart Interfaces, Technische Universität Darmstadt, Alarich-Weiss-Str. 10, 65287, Darmstadt, Germany

    Elmar Bonaccurso

  3. Airbus Group Innovations, Metallic Technologies and Surface Engineering – TX2, 81663, Munich, Germany

    Elmar Bonaccurso

Authors
  1. Ling Sun
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  2. Elmar Bonaccurso
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Correspondence to Ling Sun .

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Editors and Affiliations

  1. Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA

    Challa S. S. R. Kumar

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Sun, L., Bonaccurso, E. (2015). Scanning Conductive Torsion Mode Microscopy. In: Kumar, C.S.S.R. (eds) Surface Science Tools for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44551-8_6

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