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Ellipsometry of Functional Organic Surfaces and Films pp 305–324Cite as

Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 52))

Abstract

This chapter reviews the role of infrared spectroscopy in characterization of surfaces and interfaces of thin organic films. FTIR spectroscopy is widely utilized in studies of chemical bonds addressing questions concerning organization and orientation of the molecules in those films. In-situ FTIR spectroscopy frequently aids in studies of chemical reactions under a variety of experimental conditions, from high vacuum to aqueous solutions. FTIR spectroscopy can be realized in a multitude of setup geometries sensitive to a small amount of surface adsorbates. Anisotropic film properties can be studied by incorporating polarizing optics in an FTIR setup. FTIR modes of operation discussed in this chapter are Attenuated Total Reflection (ATR), transmission and reflection of the IR radiation through (or from) the sample, Polarization Modulation Infrared Reflection Absorption Spectroscopy (PM-IRRAS) and Infrared Spectroscopic Ellipsometry (IRSE). Practical considerations related to the sample properties (such as doping or roughness) and to the measurement conditions are discussed.

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Authors and Affiliations

  1. Dept. Materials Science and Engineering, Laboratory for Surface and Nanostructure Modification, Univ. of Texas at Dallas, Richardson, TX, 75080, USA

    Katy Roodenko

  2. Inst. Lavoisier, CNRS, UMR 8180, Univ. Versailles St Quentin Yvelines, 45 Av Etats Unis, 78035, Versailles, France

    Damien Aureau

  3. Inst. for Heterogeneous Material Systems, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109, Berlin, Germany

    Florent Yang

  4. Inst. of Functional Interfaces (IFG), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344, Eggenstein-Leopoldshafen, Germany

    Peter Thissen

  5. Inst. für Si-Photovoltaik, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 12489, Berlin, Germany

    Jörg Rappich

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  1. Katy Roodenko
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  2. Damien Aureau
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  3. Florent Yang
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  4. Peter Thissen
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  5. Jörg Rappich
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Correspondence to Katy Roodenko .

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Editors and Affiliations

  1. Leibniz Institute for Analytical Sciences - ISAS - e. V., Berlin, Germany

    Karsten Hinrichs

  2. Leibniz Institute of Polymer Research Analytics, Dresden, Germany

    Klaus-Jochen Eichhorn

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Roodenko, K., Aureau, D., Yang, F., Thissen, P., Rappich, J. (2014). Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy. In: Hinrichs, K., Eichhorn, KJ. (eds) Ellipsometry of Functional Organic Surfaces and Films. Springer Series in Surface Sciences, vol 52. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40128-2_15

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