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Sensitivity and Offset Voltage Testing in the Hall-Effect Sensors Made of Graphene

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Recent Advances in Automation, Robotics and Measuring Techniques

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 267))

Abstract

Paper presents the results of the hall effect testing in the graphene structures. Special hall effect structures were designed and build, using large graphene sheets. Laboratory testing stand was developed to test sensitivity and offset voltage in hall effect structures under external magnetic field. Characteristics of investigated structures were measured, including such impacting factors as structure size, external magnetic field strength, temperature and time.

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Authors and Affiliations

  1. Industrial Research Institute for Automation and Measurements PIAP, Al. Jerozolimskie 202, 02-486, Warsaw, Poland

    Oleg Petruk, Wojciech Winiarski & Krzysztof Trzcinka

  2. Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525, Warsaw, Poland

    Roman Szewczyk, Jacek Salach & Michał Nowicki

  3. Institute of Electronic Materials Technology, Wólczyńska 133, 01-919, Warsaw, Poland

    Tymoteusz Ciuk, Włodzimierz Strupiński & Iwona Pasternak

Authors
  1. Oleg Petruk
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  2. Roman Szewczyk
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  3. Tymoteusz Ciuk
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  4. Włodzimierz Strupiński
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  5. Jacek Salach
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  6. Michał Nowicki
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  7. Iwona Pasternak
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  8. Wojciech Winiarski
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  9. Krzysztof Trzcinka
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Corresponding author

Correspondence to Oleg Petruk .

Editor information

Editors and Affiliations

  1. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Roman Szewczyk

  2. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Cezary Zieliński

  3. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Małgorzata Kaliczyńska

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© 2014 Springer International Publishing Switzerland

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Petruk, O. et al. (2014). Sensitivity and Offset Voltage Testing in the Hall-Effect Sensors Made of Graphene. In: Szewczyk, R., Zieliński, C., Kaliczyńska, M. (eds) Recent Advances in Automation, Robotics and Measuring Techniques. Advances in Intelligent Systems and Computing, vol 267. Springer, Cham. https://doi.org/10.1007/978-3-319-05353-0_60

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  • DOI: https://doi.org/10.1007/978-3-319-05353-0_60

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-05352-3

  • Online ISBN: 978-3-319-05353-0

  • eBook Packages: EngineeringEngineering (R0)

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