Abstract
In order to properly interpret images of nerve cells observed in the scanning electron microscope (EM), it is of fundamental importance that fixation, dehydration, critical point drying (CAD), and metal deposition be accompanied with minimal distortion of nerve and glial cell structures and their cytoarchitectonic arrangement within a gray center. It is also of importance that any artifacts which are ever produced be recognized.
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© 2003 Springer Science+Business Media New York
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Castejón, O.J. (2003). Sample Preparation Methods for Scanning Electron Microscopy. In: Scanning Electron Microscopy of Cerebellar Cortex. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-0159-6_1
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DOI: https://doi.org/10.1007/978-1-4615-0159-6_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-47711-9
Online ISBN: 978-1-4615-0159-6
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