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Sample Preparation Handbook for Transmission Electron Microscopy

Methodology

  • Book
  • © 2010

Overview

Authors:
  1. Jeanne Ayache

    1. Laboratoire de Microscopie Moléculaire et Cellulaire, Institut Gustave Roussy Unité mixte CNRS-UMR8126-IGR, Villejuif CX, France

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  2. Luc Beaunier

    1. Labo. Interfaces et Systèmes Electrochimiques, Université Paris VI UPR 15 CNRS Boîte courrier 133, Paris CX 05, France

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  3. Jacqueline Boumendil

    1. Centre de Microscopie Electronique Appliquée à la Biologie et à la Géologie, Université Lyon I, Villeurbanne CX, France

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  4. Gabrielle Ehret

    1. Inst. Physique et Chimie des Matériaux, Université Strasbourg CNRS-UMR 7504, Strasbourg CX 2, France

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  5. Danièle Laub

    1. Faculté des Sciences de Base Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland

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  • First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials

  • Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)

  • Includes supplementary material: sn.pub/extras

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Table of contents (9 chapters)

  1. Front Matter

    Pages i-xxiii
    Download chapter PDF

  2. Methodology: General Introduction

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 1-2

  3. Introduction to Materials

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 3-31

  4. The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 33-55

  5. Materials Problems and Approaches for TEM and TEM/STEM Analyses

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 57-81

  6. Physical and Chemical Mechanisms of Preparation Techniques

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 83-123

  7. Artifacts in Transmission Electron Microscopy

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 125-170

  8. Selection of Preparation Techniques Based on Material Problems and TEM Analyses

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 171-197

  9. Comparisons of Techniques

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 199-234

  10. Conclusion: What Is a Good Sample?

    • Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 235-236

  11. Back Matter

    Pages 237-250
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Keywords

About this book

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Authors and Affiliations

  • Laboratoire de Microscopie Moléculaire et Cellulaire, Institut Gustave Roussy Unité mixte CNRS-UMR8126-IGR, Villejuif CX, France

    Jeanne Ayache

  • Labo. Interfaces et Systèmes Electrochimiques, Université Paris VI UPR 15 CNRS Boîte courrier 133, Paris CX 05, France

    Luc Beaunier

  • Centre de Microscopie Electronique Appliquée à la Biologie et à la Géologie, Université Lyon I, Villeurbanne CX, France

    Jacqueline Boumendil

  • Inst. Physique et Chimie des Matériaux, Université Strasbourg CNRS-UMR 7504, Strasbourg CX 2, France

    Gabrielle Ehret

  • Faculté des Sciences de Base Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland

    Danièle Laub

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